In recent years, the preservation and conservation of ancient cultural heritage necessitate the advancement of sophisticated non-destructive testing methodologies to minimize potential damage to ...
The process of printing defect detection usually suffers from challenges such as inaccurate defect extraction and localization, caused by uneven illumination and complex textures. Moreover, image ...
“Semiconductor lithography inspection requires reliable detection of small pattern defects such as bridge, burr, pinch, and contamination. In this study, we propose a two-stage vision-language ...
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