SE: Especially with advanced nodes, there are many types of variation in the process and today’s design and verification tools have to understand this. How does variation impact the sphere of your ...

While contact gate pitch (GP) and fin pitch (FP) scaling continues to provide higher performance and lower power to finFET platforms, controlling RC parasitics and achieving higher transistor ...

Revealing another piece of its DFM tool arsenal, Synopsys Inc. today detailed its new process-aware design-for-manufacturing (PA-DFM) tools, meant to analyze variability effects at the custom/analog ...

One challenge faced by all control systems integrators (CSIs) is the prospect of testing their software before deployment. CSIs often work remotely, without having the actual equipment to manipulate, ...